KLIPPEL Product Specifications
With over 25 years of experience in audio measurement, our development team has produced a wide range of scientific and technical papers, training materials, and other useful information to assist you in your daily work and to help with your audio testing needs. This includes specifications for our respective products. Please browse through the following collection. For further information, please visit our product pages and our Application Notes.
Combined Sets
- C2 - Suspension Parts Measurement Pro (SPM Pro Set)
- C3 - QC End-of-Line Test Framework
- C4 - Material Parameter Measurement (MPM Set)
- C5 - Scanning Vibrometer
- C6 - Linear Suspension Test (LST Set)
- C7 - Suspension Parts Measurement Lite (SPM Lite Set)
- C8 - Near Field Scanner
- C10 - Micro Suspension Part Measurement Lite (MSPM Lite Set)
- C11 - Micro Suspension Part Measurement Pro (MSPM Pro Set)
- C12 - SCN Near Field Add-on
Framework
Hardware
Accessories
Measurement Service
Software Modules
- S1 - Large Signal Identification (LSI)
- S2 - Linear Parameter Measurement (LPM)
- S3 - Simulation (SIM)
- S4 - 3D Distortion Measurement (DIS)
- S5 - Auralization (AUR)
- S6 - Power Test (PWT)
- S7 - Transfer Function (TRF)
- S8 - Transfer Function Pro (TRF-Pro)
- S12 - Automation
- S13 - Motor and Suspension Check (MSC)
- S14 - Remote Configuration
- S15 - Match Speaker Tool (MSP)
- S16 - Klippel Endurance Testing (KET)
- S17 - Documentation Module (DOC)
- S18 - Air Leak Detection (ALD)
- S20 - Meta-Hearing Defect Detection (MHT)
- S21 - Production Noise Immunity (PNI)
- S24 - Simulation-Auralization (SIM-AUR)
- S30 - Air Leak Stethoscope (ALS)
- S31 - External Devices (EXD)
- S32 - External Synchronization (SYN)
- S33 - Equalization + Alignment (EQA)
- S34 - IO & Prompt Task
- S35 - Yield Statistics (YST)
- S36 - Feature Libraries
- S37 - Dynamic Excursion Check and Control (DCX)
- S39 - Balanced Armature Check (BAC)
- S40 - Data Extraction (db extract)
- S41 - Polar Far-Field Measurement (POL)
- S44 - Tone Burst Measurement (TBM)
- S45 - Poly2SCN Interface
- S47 - B-Field Scanner Software (BFS)
- S48 - Statistics (STAT)
- S49 - Rocking Mode Analysis (RMA)
- S52 - Large Signal Identification (LSI3)
- S53 - Programmable Post-Processing (PPP)
- S55 - Post-Processing Task (PP)
- S56 - Live Audio Analyzer (LAA)
- S58 - Linear Simulation (LSIM)
- S60 - Higher Modal Analysis (HMA)
- S61 - Time Frequency Analysis (TFA)
- S62 - In Situ Room Compensation (ISC)
- S63 - Spectrogram 3D Limits (3DL)
- S64 - Multi-Tone Measurement (MTON)
- S65 - Spectrum Analysis (SAN)
- S66 - KCS-ID Parameter Identification
- S67 - Hi-2 Distortion Measurement (Hi-2)
- S68 - Multi-Tone Distortion (MTD)
- S71 - TRF Voltage Stepping (STEP)
- S72 - KCS Software Library
- S73 - KCS Monitor Software
- S74 - Nonlinear Residual Analyzer (NRL)