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Diagnostics of Audio Systems
Speaker Control

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Headphone Testing
AN 73_QC Headphone Testing
Get more Information
KLIPPEL Lecture in Taiwan
New Hardware
KA3
"What's new in dB-Lab 210"
dB-Lab 210 vs. QC6
Specification of Suspension Parts
Micro Suspension Part Measurement (MSPM)
Near Field Scanner 3D
Near Field Scanner System (NFS)
Speaker Testing in a Pot?
Vacuum Measurement Kit
Sound Quality of Audio System - Lecture 2019
... Join us in March 2019 for Prof. Klippel Lecture at the Technical Universtiy Dresden, Germany
R&D System
QC System
Listening Test
E-Learning
Upcoming Events
  • 11/2018: Workshop: Optimizing Performance / Cost Ratio of Audio Devices through Efficient End‐of‐line Testing
  • 11/2018: Seminar in Shenzhen and Shanghai
  • 03/2019: Three-day Lecture by Prof. Wolfgang Klippel
  • 06/2019: ALMA 2019
New Products
  • CST becomes STAT
  • Controlled Sound Technology
  • Near Field Scanner System
New Publications
  • Maximizing Efficiency in Active Loudspeaker Systems
  • Challenges of Testing Mobile Devices and Mobile Testing
  • Fast and Sensitive End of Line Testing
  • AN_73: QC Headphone Testing
  • Audio System Evaluation with Music Signals
  • AN_70: Directivity of Speaker Arrays
  • AN_69: Far Field Measurement using Microphone Arrays
  • Assessment of Harshness caused by Rattling Car Interios
  • Adaptive Stabilization of transducers
  • On-line Input Equalization
 

Klippel GmbH

Mendelssohnallee 30
01309 Dresden/Germany
Phone: 49.351.5019390
Fax: 49.351.50193910 
info(at)klippel(dot)de

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