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Diagnostics of Audio Systems
Speaker Control

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Speaker Testing in a Pot?
Vacuum Measurement Kit
New Hardware released
KA3
Specification of Suspension Parts
Micro Suspension Part Measurement (MSPM)
Near Field Scanner 3D
Near Field Scanner System (NFS)
Sound Quality of Audio System - Lecture 2019
... Join us in March 2019 for Prof. Klippel Lecture at the Technical Universtiy Dresden, Germany
Headphone Testing
AN73_Quality Control of Headphones
R&D System
QC System
Listening Test
E-Learning
Upcoming Events
  • 10/2018: AES New York 2018
  • 11/2018: Workshop: Optimizing Performance / Cost Ratio of Audio Devices through Efficient End‐of‐line Testing
  • 02/2019: ProLight & Sound Guangzhou - PR China
  • 03/2019: Three-day Lecture by Prof. Wolfgang Klippel
  • 06/2019: ALMA 2019
New Products
  • CST becomes STAT
  • Controlled Sound Technology
  • Near Field Scanner System
  • FEA2SCN Module for Scanning Vibrometer System
  • Micro Suspension Part Measurement
  • DIF-AUR Module for Auralization of Signal Differences
New Publications
  • Audio System Evaluation with Music Signals
  • AN_70: Directivity of Speaker Arrays
  • AN_69: Far Field Measurement using Microphone Arrays
  • Assessment of Harshness caused by Rattling Car Interios
  • Adaptive Stabilization of transducers
  • On-line Input Equalization
 

Klippel GmbH

Mendelssohnallee 30
01309 Dresden/Germany
Phone: 49.351.5019390
Fax: 49.351.50193910 
info(at)klippel(dot)de

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